IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY

期刊基本信息

期刊名称：IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY

出版国家或地区：UNITED STATES

是否OA：No

期刊ISSN：1530-4388

期刊官方网站：http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=7298

期刊投稿网址：http://mc.manuscriptcentral.com/tdmr

通讯方式：IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 445 HOES LANE, PISCATAWAY, USA, NJ, 08855-4141

涉及的研究方向：工程技术-工程：电子与电气

出版周期：Quarterly

期刊数据表：

IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY英文简介：

IEEE Transactions on Device and Materials Reliability is published quarterly. It provides leading edge information that is critical to the creation of reliable electronic devices and materials, and a focus for interdisciplinary communication in the state of the art of reliability of electronic devices, and the materials used in their manufacture. It focuses on the reliability of electronic, optical, and magnetic devices, and microsystems; the materials and processes used in the manufacture of these devices; and the interfaces and surfaces of these materials.

IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY中文简介：

IEEE设备和材料可靠性事务季刊。它提供对可靠电子设备和材料的创造至关重要的前沿信息，并在电子设备及其制造中使用的材料的可靠性方面成为跨学科交流的重点。它侧重于电子、光学、磁器件和微系统的可靠性;用于制造这些装置的材料和工艺;以及这些材料的界面和表面。

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